Transformer & Wound Component (Inductance) Analyzers
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High Current DC Bias |
3255BL
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- Frequency range (20Hz - 200kHz)
- 0.1% basic accuracy
- Z, L, C, Rac, Ř, Q, D, Rdc & Turns Ratio
- 1 A DC bias current (option)
- Up to 50A with 5 x 3265B/10A
- Binning function (option)
- Multi-frequency mode
- Fast measurement speed (up to 20 measurements per second)
- Straight forward intuitive operation
- Print test results
- IEEE488 control using FREE LabVIEW™ driver
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| Screen Capture (NI) |
download |
| Screen Capture (USB) |
download |
| Labview Driver |
download |
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data sheet |
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information
request... |
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3255B
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- Wide frequency range (20Hz - 500kHz)
- 0.1% basic accuracy
- Z, L, C, Rac, Ř, Q, D, Rdc & Turns Ratio
- 1 A DC bias current (option)
- Up to 125 A with 5 x 3265B
- Binning function (option)
- Multi-frequency mode
- Fast measurement speed (up to 20 measurements per second)
- Straight forward intuitive operation
- Print test results
- IEEE488 control using FREE LabVIEW™ driver
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| Screen Capture (NI) |
download |
| Screen Capture (USB) |
download |
| Labview Driver |
download |
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data sheet |
|
information
request... |
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3255BQ
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- Wide frequency range (20Hz - 1MHz)
- 0.1% basic accuracy
- Z, L, C, Rac, Ř, Q, D, Rdc & Turns Ratio
- 1 A DC bias current (option)
- Up to 125 A with 5 x 3265B
- Binning function (option)
- Multi-frequency mode
- Fast measurement speed (up to 20 measurements per second)
- Straight forward intuitive operation
- Print test results
- IEEE488 control using FREE LabVIEW™ driver
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|
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| Screen Capture (NI) |
download |
| Screen Capture (USB) |
download |
| Labview Driver |
download |
|
data sheet |
|
information
request... |
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3260B
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- Wide frequency range (20Hz - 3MHz)
- 0.1% basic accuracy
- Z, L, C, Rac, Ř, Q, D, Rdc & Turns Ratio
- IR testing to 500V DC (option)
- 1 A DC bias current
- Up to 125 A with 5 x 3265B
- Telecom measurement function (option)
- Analysis mode - graph measured parameters against Frequency,
AC Drive Level & DC Bias Current
- Comprehensive measurement functions - including leakage tests
- Fast measurement speed (up to 20 measurements per second)
- Straight forward intuitive operation
- Print test results
- IEEE488 control using FREE LabVIEW™ driver
|
 |
| Screen Capture (NI) |
download |
| Screen Capture (USB) |
download |
| Labview Driver |
download |
| Specification |
download |
|
data sheet |
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information request... |
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3265B/5A
3265B/10A
3265B/20A
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- Testing wound devices under application conditions
- 25 mA to 5 A, 10A or 20A of DC bias current in 0.025 A steps
- Up to 11 V DC compliance voltage
- Applicable for measurement functions L, R, D, Q, Z
- 20 Hz to 200 kHz (3255BL)
- 20 Hz to 500 kHz (3255B)
- 20 Hz to 1 MHz (3260B)
- Basic accuracy 1%
- 4 or 2 terminal measurements
- Up to 5 bias units may be connected in parallel to provide
five times the output current
- Safety interlock to protect operator from back-EMFs
- Easily rack-mountable with inductance analyzer
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Specification |
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data sheet |
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information
request... |
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3265B/25A
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- Testing wound devices under application conditions
- 25 mA to 25 A DC bias in 0.025 A steps
- Up to 11 V DC compliance voltage
- Applicable for measurement functions L, R, D, Q, Z
- 20 Hz to 500 kHz (3255B)
- 20 Hz to 1 MHz (3260B)
- Basic accuracy 1%
- 4 or 2 terminal measurements
- Up to 5 bias units may be connected in parallel to provide up
to 125 A
- Safety interlock to protect operator from back-EMFs
- Easily rack-mountable with inductance analyzer
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Specification |
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data sheet |
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information
request... |
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3265BQ/25A
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- Testing wound devices under application conditions
- 25 mA to 25 A DC bias in 0.025 A steps
- Up to 11 V DC compliance voltage
- Applicable for measurement functions L, R, D, Q, Z
- 20 Hz to 500 kHz (3255B)
- 20 Hz to 3 MHz (3260B)
- Basic accuracy 1%
- 4 or 2 terminal measurements
- Up to 2 bias units connected in parallel to provide up to 50
A
- Up to 5 bias units connected in parallel to provide up to 125
A (< 1 MHz)
- Safety interlock to protect operator from back-EMFs
- Easily rack-mountable with inductance analyzer
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Specification |
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data sheet |
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information request... |
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